References

Semiconductor Physics, Quantum Electronics and Optoelectronics, 12 (3) P. 264-271 (2009).
DOI: https://doi.org/10.15407/spqeo12.03.264

References

1. Ch. Brosseau, Fundamentals of Polarized Light. A Statistical Optics Approach. North-Holland Publishing Company, New York, p. 406, 1998.

2. M.I. Mishchenko, L.D. Travis, A.A. Lacis, Scattering, Absorption, and Emission of Light by Small Particles. Cambridge University Press, Cambridge, p. 449, 2002.

3. S.L. Durden, J.J. van Zyl, and H.A. Zebker, The unpolarized component in polarimetric radar observations of forested areas // IEEE Trans. Geoscience and Remote Sensing 28, p. 268-271 (1990). https://doi.org/10.1109/36.46706

4. S.L. Jacques, R.J. Roman and K. Lee, Imaging skin pathology with polarized light // J. Biomed. Opt. 7, p. 329-340 (2002). https://doi.org/10.1117/1.1484498

5. S.P. Morgan, I.M. Stockford, Surface-reflection elimination in polarization imaging of superficial tissue // Opt. Lett. 28, p. 114-116 (2003). https://doi.org/10.1364/OL.28.000114

6. J.M. Schmitt, A.H. Gandjbakhche and R.F. Bonner, Use of polarized light to discriminate short path photons in a multiply scattering medium // Appl. Opt. 31, p. 6535-6546 (1992). https://doi.org/10.1364/AO.31.006535

7. P.S. Hauge, Resent developments in instrumentation in ellipsometry // Surf. Sci. 96, p. 108-140 (1980). https://doi.org/10.1016/0039-6028(80)90297-6

8. A.M. Shutov, The optical systems of devices for measuring the parameters of polarized radiation // Optiko-mekhanicheskaya promyshlennost' 11, p. 52-56 (1985) (in Russian).

9. R.M.A. Azzam, Mueller-matrix ellipsometry: review // Proc. SPIE 3121, p. 396-405 (1997). https://doi.org/10.1117/12.283870

10. J.S. Tyo, D.L. Goldstein, D.B. Chenault and J.A. Shaw, Review of passive imaging polarimetry for remote sensing applications // Appl. Opt. 45(22), p. 5453-5469 (2006). https://doi.org/10.1364/AO.45.005453

11. R.M.A. Azzam, Arrangement of four photodetectors for measuring the state of polarization of light // Opt. Lett. 10, p. 309-311 (1985). https://doi.org/10.1364/OL.10.000309

12. M. Born and E. Wolf, Principles of Optics. Pergamon, New York, p. 554, 1975.

13. A. Ambirajan and D.C. Look, Optimum angles for a polarimeter: part 1 // Opt. Eng. 34, p. 1651-1655 (1995). https://doi.org/10.1117/12.202093

14. P.S. Hauge and F.H. Dill, A rotating-compensator Fourier ellipsometer // Opt. Communs. 14, p. 431- 437 (1975). https://doi.org/10.1016/0030-4018(75)90012-7

15. P.S. Huge, Generalized rotating-compensator ellipsometry // Surf. Sci. 56, p. 148-160 (1976). https://doi.org/10.1016/0039-6028(76)90442-8

16. D.S. Sabatke, M.R. Descour and E.L. Dereniak, Optimization of retardance for a complete Stokes polarimeter // Opt. Lett. 25(11), p. 802-804 (2000). https://doi.org/10.1364/OL.25.000802

17. I.J. Vaughn and B.G. Hoover, Noise reduction in a laser polarimeter based on discrete waveplate rotations // Opt. Exp. 16(3), p. 2091-2108 (2006). https://doi.org/10.1364/OE.16.002091

18. R.M.A. Azzam, I.M. Elminyawi and A.M. El-Saba, General analysis and optimization of the fourdetector photopolarimeter // J. Opt. Soc. Amer. A 5, p. 681-689 (1988). https://doi.org/10.1364/JOSAA.5.000681

19. V.A. Dlugunovich, V.N. Snopko and O.V. Tsaryuk, Analysis of a method for measuring polarization characteristics with a Stokes polarimeter having a rotating phase plate // J. Opt. Technol. 68(4), p. 269-273 (2001). https://doi.org/10.1364/JOT.68.000269

20. J.S. Tyo, Noise equalization in Stokes parameter images obtained by use of variable-retardance polarimeters // Opt. Lett. 25, p. 1198-1200 (2000). https://doi.org/10.1364/OL.25.001198

21. S.N. Savenkov, Optimization and structuring of the instrument matrix for polarimetric measurements // Opt. Eng. 41, p. 965-972 (2002). https://doi.org/10.1117/1.1467361

22. V.A. Dlugunovich, E.A. Kuplevich and V.N. Snopko, Minimizing the measurement error of the Stokes parameters when the setting angles of a phase plate are varied // J. Opt. Technol. 67(9), p. 792-800 (2000). https://doi.org/10.1364/JOT.67.000797

23. J.S. Tyo, Design of optimal polarimeters: maximization of signal-to-noise ratio and minimization of systematic errors // Appl. Opt. 41, p. 619-630 (2002). https://doi.org/10.1364/AO.41.000619

24. J. Zallat, S. Ainouz, and M.Ph. Stoll, Optimal configurations for imaging polarimeters: impact of image noise and systematic errors // J. Opt. A 8, p. 807-814 (2006). https://doi.org/10.1088/1464-4258/8/9/015

25. J.R. Taylor, An Introduction to Error Analysis, 2 ed. Univ. Sci. Books, Mill Valley, p. 349, 1997.

26. F.R. Gantmacher, The Theory of Matrices. AMS Chelsea Publishing, Reprinted by Amer. Mathemat. Soc., p. 660, 2000.

S.N. Savenkov, Yu.A. Skoblya, K.E. Yushtin, and A.S. Klimov, Mueller matrix polarimetry with multi-purpose polarization transducer // Proc. SPIE 5772, p. 77-85 (2005). https://doi.org/10.1117/12.636829