Semiconductor Physics, Quantum Electronics & Optoelectronics. 2014. V. 17, N 3. P. 232-236.
https://doi.org/10.15407/spqeo17.03.232

                                                                 

Structural and optical studies of (Ag3AsS3)0.6(As2S3)0.4 thin films deposited at different technological conditions
I.P. Studenyak1, Yu.Yu. Neimet1, Y.Y. Rati1, M.Yu. Buchuk1, S. Kokenyesi2, L. Daroci2, R. Bohdan2

1Uzhhorod National University, Faculty of Physics, 3, Narodna Sq., 88000 Uzhhorod, Ukraine
2University of Debrecen, Department of Experimental Physics, Faculty of Science and Technology,
18/a Bem Sq., 4026 Debrecen, Hungary, E-mail: studenyak@dr.com

Abstract. (Ag3AsS3)0.6(As2S3)0.4 thin films were deposited upon a quartz substrate by rapid thermal evaporation at temperatures 1050, 1200, and 1350 C. Structural studies of the as-deposited thin films were carried out by scanning electron microscopy and atomic force microscopy. It is shown that the surfaces of all the films were covered with Ag-rich crystalline micrometer sized cones. The optical transmission spectra for as-deposited thin films were studied at room temperature. The absorption spectra in the region of its exponential behaviour were analyzed, the dispersion dependences of refractive index as well as their variation depending on evaporation temperature were investigated.

Keywords:thin film, thermal evaporation, SEM, AFM, optical absorption.

Manuscript received 26.02.14; revised version received 24.07.14; accepted for publication 16.09.14; published online 30.09.14.

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