Semiconductor Physics, Quantum Electronics & Optoelectronics. 2016. V. 19, N 3. P. 248-254.
DOI: https://doi.org/10.15407/spqeo19.03.248

Degradation processes in LED modules

V.M. Sorokin1, Ya.Ya. Kudryk1, V.V. Shynkarenko1, R.Ya. Kudryk2, P.O. Sai1

1V. Lashkaryov Institute of Semiconductor Physics, NAS of Ukraine 41, prospect Nauky, 03680 Kyiv, Ukraine, E-mail: kudryk@isp.kiev.ua; shynkarenko@isp.kiev.ua
2Ivan Franko National University of Lviv 1, Universytetska str., 79000 Lviv, Ukraine

Abstract. Electrical-heat-light degradation model of a light-emitting module has been developed in this work. The Monte-Carlo method was used to calculate the reliability time of LED modules with different halfwidth of LED chip series resistance. Separation of LED chips with different series resistance before assembling may increase the time of emission in a stable mode up to 10%.

Keywords: LED, degradation, thermal resistance, junction-to-heatsink thermal resistance.

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