Semiconductor Physics, Quantum Electronics & Optoelectronics. 2016. V. 19, N 3. P. 255-266.
Transducer based on surface plasmon resonance with thermal modification of metal layer properties
V. Lashkaryov Institute of Semiconductor Physics, NAS of Ukraine, 41, prospect Nauky, 03680 Kyiv, Ukraine
E-mail: biosen@isp.kiev.ua
Abstract. With the purpose to improve such service characteristics of transducers on the basis of the surface plasmon resonance (SPR) as the sensitivity and stability, we have analyzed the influences of a structure and a relief of the surface of polycrystalline gold films, which are determined by technological conditions of their production and by the low-temperature annealing, on their optical characteristics, namely, the coefficients of refraction, extinction, and light scattering. It is shown that the mechanism of enhancement of the sensitivity of an SPR-based transducer consists in a decrease in the coefficient of extinction of a metal film, as the annealing temperature increases. At the optimum annealing temperature (120C), we observed the smoothing of a small-scale roughness of the gold film surface, which decreases the scattering of plasmons, favors the defectless formation of protective nano-sized layers, and enhances the sensitivity and stability of the operation of SPR-based transducers.
Keywords: surface plasmon resonance, gold films, low-temperature annealing, microrelief of the surface, optical constants, service characteristics of an SPR-based transducer.
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