PACS: 78.66; 78.20.C

Optical properties of thin metal films

S.A.Kovalenko

Semiconductor Physics, Quantum Electronics and Optoelectronics - 1999. - 2, №3. - P.13-20. - Engl. Il.: 17. Ref.: 25.

Abstract. Optical constants of metallic thin films made from: Ag, Au, Hf, Ir, Mo, Nb, Os, Pd, Pt, Re, Rh, Ru, Ta, W, Zr – were determined on the basis of measured index of refraction in region of wavelength l = 24–1216 A . two types of relations were used for the calculation. Some of them were obtained, with taking into account that refractive index of absorbing medium can be presented in the form n = n ± i? . Other were obtained from Maxwell boundary condition.

Both approaches give rise to very close resultss for ? , however the dependences n = f(l) for l > 200 A are essentially different. The reasons of such differences are discussed.

Keywords: thin layers, refraction coefficient, transmission coefficient, refraction index, absorbtion index

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