Semiconductor Physics, Quantum Electronics & Optoelectronics, 3 (4), P. 456-459 (2000)
https://doi.org/10.15407/spqeo3.04.456 Semiconductor Physics, Quantum Electronics & Optoelectronics. 2000. V. 3, N 4. P. 456-459. PACS: 61.43.D, 64.70.D,66.20 Structural changes in molten CdTeL. Shcherbak1, P. Feychuk1, Yu. Plevachuk2, Ch. Dong3 and V. Sklyarchuk21Chemical Department, University of Chernivtsi, 2, vul. Kotsyubinskogo, 274012 Chernivtsi, Ukraine Abstract. Shear viscosity (h) measurements of CdTe and CdTe + 2 at% In melts were performed using a cup viscometer up to 1403 K. The h(T) dependencies obtained during slow heating and cooling (Vh/c = = 10-15 K/h) show hysteresys near a melting point. According to the h(T) dependencies data drastic changes the melts structure occurred at 1376 K both during the heating and cooling of the melts. Keywords: CdTe, viscosity, structural changes, melts
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