Semiconductor Physics, Quantum Electronics and Optoelectronics, 4 (4) P. 253-259 (2001).


References

1. H.Palm, M.Arbes, and M.Schulz, Fluctuations of the Au-Si(100) Schottky Barrier Height // Phys.Rev.Lett.71, pp.2224-2227 (1993).
https://doi.org/10.1103/PhysRevLett.71.2224
2. T.Sumiya, T.Miura, H.Fujinuma, and Sh.Tanaka, Schottky barrier inhomogeneity at Au/Si(111) interfaces using ultrahigh-vacuum ballistic electron emission microscopy // Appl.Surf.Sci. 117-118, pp.329-333 (1997).
https://doi.org/10.1016/S0169-4332(97)80103-1
3. K.Maeda, and E.Kitahara, Metal-induced gap states model of nonideal Au/Si Schottky barrier with low defect density // Appl.Surf.Sci. 130-132, pp.925- 929 (1998).
https://doi.org/10.1016/S0169-4332(98)00178-0
4. F.Gozzo, M.Marsi, H.Berger, G.Margaritondo, A.Ottolenghi, A.K.Ray-Chaudhuri, W.Ng, S.Liang, S.Singh, J.T.Welnak, J.P.Wallace, C.Capasso, and F.Cerrina, Microscopic-scale lateral ingomogeneities of the Schottky-barrier-formation process // Phys.Rev.(B)48, pp.17163-17167 (1993).
https://doi.org/10.1103/PhysRevB.48.17163
5. M.Zacchigna, H.Berger, L.Sirigu, G.Margaritondo, G.F.Lorusso, H.Solak, and F.Cerrina, A spectromicroscopy study of the Al/GaS interface: Evidence of band bending lateral inhomogeneities // J. of Electron Spectroscopy and Related Phenomena 101-103, pp.671-675 (1999).
https://doi.org/10.1016/S0368-2048(98)00334-X
6. J.Almeida, G.Margaritondo, C.Coluzza, S.Davy, M.Spajer, and D.Courjon, Laterally-resolved study of the Au/SiNX/GaAs(100) interface // Appl.Surf.Sci. 125, pp.6-10 (1998).
https://doi.org/10.1016/S0169-4332(97)00411-X
7. Young Pil Kim, Si Kyung Choi, Hyun Kyong Kim, and Dae Won Moon, Direct observation of the Si lattice strain and its distribution in the Si(001)-SiO2 interface transition layer // Appl.Phys.Lett.71, pp.3504-3506 (1997).
https://doi.org/10.1063/1.120373
8. Changyoung Kim, Paul L.King, and P.Pianetta, Fermi-level inhomogeneities on the GaAs(110) surface imaged with a photoelectron microscope // J.Vac.Sci.Technol.(b)10, pp.1944-1948 (1992).
https://doi.org/10.1116/1.586163
9. V.B.Bondarenko, Yu.A.Kudinov, S.E.Ershov, and V.V.Korablev, Natural the potential fluctuations at a doped semiconductor surface // FTP, 30, pp.2068-2075 (1996).
10. J.Tauc. Photo- and Thermoelectric Phenomena in Semiconductors (Russian translation). Mir, Moscow, 1962.
11. M.Alonso, R.Cimino, and K.Horn, Surface Photovoltage Effects in Photoemission from Metal-GaP(110) Interfaces: Importance for Band-Bending Evaluation // Phys.Rev.Lett. 64,pp.1947-1950 (1990).
https://doi.org/10.1103/PhysRevLett.64.1947
12. D.Mao, A.Kahn, G.Le Lay, M.Marsi, Y.Hwu, and G.Margaritondo, Kelvin probe and synchrotron radiation study of surface photovoltage and band bending at metal/GaAs(100) interfaces // Appl.Surf.Sci. 56-58, pp.142-150 (1992).
https://doi.org/10.1016/0169-4332(92)90227-O
13. L.V.Shekhovtsov, A.V.Sachenko, and Yu.I.Shwarts, Transverse photo-emf in a heteroepitaxial structure // FTP,29, pp.566-573(1995)].
14. D.E.Aspnes, and A.A.Studna, Dielectric functions and optical parameters of Si, Ge, GaP, GaAs, GaSb, InP, InAs, and InSb from 1.5 to 6.0 eV // Phys.Rev.(B)27, pp.985-1009 (1983).
https://doi.org/10.1103/PhysRevB.27.985
15. S.M.Ryvkin. Photoelectric Phenomena in Semiconductors (inRussian). GIFML, Moscow, 1963.
16. J.T.Wallmark, A New Semiconductor Photocell Using Lateral Photoeffect // Proc.IRE 45,pp.474-483(1957).
https://doi.org/10.1109/JRPROC.1957.278435
17. I.Hotovy, J.Brcka, and J.Huran, Investigation of Reactively Sputtered NbN Films // Fizika (A) 4, pp.337-342 (1995).
18. M.D.Sturge, Optical absorbtion of gallium arsenide between 0.6 and 2.75eV // Phys.Rev.127, pp.768-773 (1962).
https://doi.org/10.1103/PhysRev.127.768
19. F.Bechstedt, and R.Enderlein, Semiconductor Surfaces and Interfaces, Akademie-Verlag, Berlin, 1988.
20. V.N.Ovsyuk, Electronic Processes in Semiconductors with Space Charge Region (in Russian). Nauka, Novosibirsk, 1984.
21. L.V.Shekhovtsov, The Real Band Diagram for the Metal-Semiconductor Heterojunction // Proc.22-nd Int.Conf.on Microelectronics (MIEL-2000, Niš, Yugoslavia)2, pp.193-195 (2000).