https://doi.org/10.15407/spqeo5.04.398
Semiconductor Physics, Quantum Electronics & Optoelectronics. 2002. V. 5, N 4. P. 398-402.
PACS: 07.50.H
Noise in HgCdTe LWIR arrays
F.F. Sizov, A.G. Golenkov, V.V. Zabudsky,
V.P. Reva
Institute of Semiconductor Physics, 41 prospect Nauky, 03028 Kiev, Ukraine; e-mail: sizov@isp.kiev.ua
Abstract. Mercury
cadmium telluride (MCT) hybrid arrays
for long-wavelength infrared (LWIR) applications with n+-p-diodes and
n-channel charged coupled devices (CCD) silicon readouts were designed,
manufactured and tested. Performance of these arrays at T 80 K is considered.
The measurements of noise and signal-to-noise ratio (SNR) are the key
issues to determine performance parameters to characterize IR-sensors.
That puts certain requirements to the registration system and used methods
of measuring signals. To find out and eliminate noise sources the spectral
noise power of signals was analyzed. It allowed the possibility to implement
actions for reducing of the registration system noise, and to define the
software noise filters to be used.
Keywords: MCT multielement
linear arrays, noise measurements, detectivity, CCD readouts.
Paper received 02.08.02; accepted for publications
17.12.02.
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