Semiconductor Physics, Quantum Electronics & Optoelectronics, 5 (4), P. 398-402 (2002)
https://doi.org/10.15407/spqeo5.04.398


Semiconductor Physics, Quantum Electronics & Optoelectronics. 2002. V. 5, N 4. P. 398-402.

PACS: 07.50.H

Noise in HgCdTe LWIR arrays
F.F. Sizov, A.G. Golenkov, V.V. Zabudsky, V.P. Reva

Institute of Semiconductor Physics, 41 prospect Nauky, 03028 Kiev, Ukraine; e-mail: sizov@isp.kiev.ua

Abstract. Mercury cadmium telluride (MCT) hybrid arrays for long-wavelength infrared (LWIR) applications with n+-p-diodes and n-channel charged coupled devices (CCD) silicon readouts were designed, manufactured and tested. Performance of these arrays at T 80 K is considered.
The measurements of noise and signal-to-noise ratio (SNR) are the key issues to determine performance parameters to characterize IR-sensors. That puts certain requirements to the registration system and used methods of measuring signals. To find out and eliminate noise sources the spectral noise power of signals was analyzed. It allowed the possibility to implement actions for reducing of the registration system noise, and to define the software noise filters to be used.

Keywords: MCT multielement linear arrays, noise measurements, detectivity, CCD readouts.
Paper received 02.08.02; accepted for publications 17.12.02.

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