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Semiconductor Physics, Quantum Electronics & Optoelectronics. 2015. V. 18, N 4. P. 456-459.
Probabilistic approach to the analysis of regularities in behavior
of material parameters of electronic equipment
under action of external fields
V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine, 41, prospect Nauky, 03028 Kyiv, Ukraine Abstract. It has been shown that the dependence between the parameters of materials of electronic equipment and external fields is determined by the distribution function of the corresponding random variable. The obtained results have been applied to the analysis of a number of physical phenomena. Keywords: random variable, distribution function, defect generation, spin-dependent reaction, magnetization of ferromagnetics.
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