¹V. Lashkaryov Institute of Semiconductor Physics, NAS of Ukraine, 41 Nauky Avenue, 03028 Kyiv, Ukraine
²Leibniz Institute of Surface Engineering, 15 Permoser Street, 04318 Leipzig, Germany
Corresponding author e-mail: k.shportko@ukr.net

Abstract. The structure and vibrational properties of glassy Ge19Te81 and Ga7.9Ge11.5Te80.6 alloys were studied using X-ray diffraction and Raman spectroscopy. The amorphous nature of the obtained alloys was confirmed by the experimental X-ray diffraction patterns. The latter were used for calculating radial distribution functions. Such calculations gave the positions of the nearest-neighbour peak r1 – 2.65 Å and second nearest-neighbour peak r2 – 4.31 and 4.44 Å. The obtained r1 values are in good agreement with the known from literature Ge-Te and Ga-Te bond lengths. Similar r1 values were also observed for Ga-Ge-Te glasses of different compositions. The r2/r1 values of 1.63 and 1.68 are close to the typical value for a regular tetrahedron structure. The observed bands in the Raman spectra of the studied Ga-Ge-Te samples show that such glasses contain different nanophases. The Raman spectra may be interpreted in terms of vibrational modes of Ga-Te and Ge-Te binary glasses and films.

Keywords: X-ray diffraction, Raman spectroscopy, glassy Ga-Ge-Te alloys.

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