Semiconductor Physics, Quantum Electronics & Optoelectronics, 3 (1), P. 102-105 (2000)
https://doi.org/10.15407/spqeo3.01.102 PACS 07.07.D,42.79.P,Q Residual error after non-uniformity correction V.N. Borovytsky Optical Engineering Department, National Technical University of Ukraine, Abstract. The paper represents the technique for residual error evaluation after two-points linear non-uniformity correction. This technique takes into consideration parameters of an imaging system, reference sources, non-linearity and noise of a focal plane array. Keywords: non-uniformity correction, photosensitive element, reference source. [Contents] This work is licensed under a Creative Commons Attribution-NoDerivatives 4.0 International License. |