Semiconductor Physics, Quantum Electronics & Optoelectronics, 3 (1), P. 102-105 (2000)
https://doi.org/10.15407/spqeo3.01.102


PACS 07.07.D,42.79.P,Q

Residual error after non-uniformity correction

V.N. Borovytsky

Optical Engineering Department, National Technical University of Ukraine,
pr. Peremogy 37, Kyiv 252 056, Ukraine

Abstract. The paper represents the technique for residual error evaluation after two-points linear non-uniformity correction. This technique takes into consideration parameters of an imaging system, reference sources, non-linearity and noise of a focal plane array.

Keywords: non-uniformity correction, photosensitive element, reference source.

[Contents]
Full text in PDF (Portable Document Format) are available for free. [PDF 131K]

Back to Volume 3 N1

Creative Commons License
This work is licensed under a Creative Commons Attribution-NoDerivatives 4.0 International License.