Exciton-enhanced recombination in silicon at high concentrations of charge carriers A.V. Sachenko, A.P. Gorban, V.P. Kostylyov
Semiconductor physics, quantum electronics and optoelectronics, 3 (1), P. 005-010 (2000).
Microfluctuations of oxygen impurity concentration as a reason of accelerated oxygen diffusion in silicon V.B. Neimash, O.O. Puzenko, A.M. Kraitchinskii, M.M. Kras'ko, S.Putselyk, C. Claeys, E. Simoen
Semiconductor physics, quantum electronics and optoelectronics, 3 (1), P. 011-014 (2000).
Ultrasound effect on radiation damages in boron implanted silicon B. Romanjuk, D. Kruger, V. Melnik, V. Popov, Ya. Olikh, V. Soroka, O. Oberemok
Semiconductor physics, quantum electronics and optoelectronics, 3 (1), P. 015-018 (2000).
Accumulation dynamics of oxygen clusters in silicon and formation of their nonhomogeneous distribution P.A.Selishchev
Semiconductor physics, quantum electronics and optoelectronics, 3 (1), P. 019-021 (2000).
Development and optical characteristics of the macroporous silicon structures L.A. Karachevtseva, O.A. Lytvynenko, O.J. Stronska
Semiconductor physics, quantum electronics and optoelectronics, 3 (1), P. 022-025 (2000).
Modification of photoelectric and electrical properties of III-V semiconductors by pulsed laser irradiation V. A. Gnatyuk, O. S. Gorodnychenko, P. O. Mozol, O. I. Vlasenko
Semiconductor physics, quantum electronics and optoelectronics, 3 (1), P. 026-030 (2000).
Laser – induced donor centers in p -InSb L. Fedorenko, A. Medvid
Semiconductor physics, quantum electronics and optoelectronics, 3 (1), P. 031-034 (2000).
Effect of thermal neutron irradiation on the electrophysical and photoelectric properties of Hg 0.8 Cd 0.2 Te crystals I.S. Virt, V.V. Gorbunov
Semiconductor physics, quantum electronics and optoelectronics, 3 (1), P. 035-038 (2000).
Luminescence and photoconductivity of poly-n-epoxypropylcarbazole with intramolecular charge transfer compounds N.A. Davidenko, N.G. Kuvshinsky, V.G. Syromiatnikov
Semiconductor physics, quantum electronics and optoelectronics, 3 (1), P. 039-044 (2000).
AFM study of micromorphology and microscopic growth mechanisms of Hg 1-x Cd x Te LPE epitaxial layers G.V. Beketov, L.V. Rashkovetskiy, O.V. Rengevych, G.I. Zhovnir
Semiconductor physics, quantum electronics and optoelectronics, 3 (1), P. 045-051 (2000).
Infrared detectors: outlook and means F. F. Sizov
Semiconductor physics, quantum electronics and optoelectronics, 3 (1), P. 052-058 (2000).
Biochemical passivation of metal surfaces for sensor application: reactive annealing of polycrystalline gold films in hydrogen sulfide atmosphere B. A. Snopok , K. V. Kostyukevych, G.V. Beketov, S.A. Zinio, Y. M. Shirshov, E.F. Venger, S.V. Veriovka
Semiconductor physics, quantum electronics and optoelectronics, 3 (1), P. 059-068 (2000).
Theoretical investigation of light absorption and scattering by nanoparticles S.I. Pokutnyi, V.V. Kovalchuk
Semiconductor physics, quantum electronics and optoelectronics, 3 (1), P. 069-076 (2000).
Optical properties, form of granules and electronic parameters of binary Al/Cr composites I.A. Shaykevich, P.V. Kolesnyk
Semiconductor physics, quantum electronics and optoelectronics, 3 (1), P. 077-081 (2000).
Science and technology excimer laser complex and examples of its applications S.M. Baschenko, I.V. Blons‘kiy.
Semiconductor physics, quantum electronics and optoelectronics, 3 (1), P. 082-090 (2000).
Strain effect in surface acoustic wave elements with a piezoelectric acoustic line and sensors based on this effect Ya.I. Lepikh
Semiconductor physics, quantum electronics and optoelectronics, 3 (1), P. 091-093 (2000).
Diffraction of optical beams by a half-plane S. Anokhov, A. Khizhnyak, R. Lymarenko
Semiconductor physics, quantum electronics and optoelectronics, 3 (1), P. 094-101 (2000).
Residual error after non-uniformity correction V.N. Borovytsky
Semiconductor physics, quantum electronics and optoelectronics, 3 (1), P. 102-105 (2000).