Semiconductor Physics, Quantum Electronics & Optoelectronics. 2009. V. 12, N 1. P. 035-041.
https://doi.org/10.15407/spqeo12.01.035

The substructural and optical characteristics of ZnTe thin films
M.M. Kolesnyk1, D.1. Kurbatov1, A.S. Opanasyuk1, V.B. Loboda2

1Sumy State University, 2, Rymsky-Korsakov str., 40007 Sumy, Ukraine
2Sumy State Pedagogical University, 87, Romenska str., 40002 Sumy, Ukraine maxxkol@yahoo.com; kurd@ukrnet; opanasyuk_sumdu@ukrnet

Abstract. The substructural and optical characteristics of ZnTe thin films obtained by close-spaced vacuum sublimation technique under different condensation conditions were investigated. The size of coherent scattering regions (CSR), the level of microstrain, stacking fault defects concentration in condensate, the average dislocations density on the subgrain boundaries and their volume were estimated with X-ray diffraction line broadening using the Hall method and the method of threefold convolution. It is shown that the mechanism of CSR size increase and the microdeformation level reduction are of the activation nature. Spectral distributions of transmission coefficient T(A), refractive index n(X), extinction coefficient k(X) and their dependences on the deposition temperature of ZnTe films are obtained.

Keywords: ZnTe thin film, X-ray analysis, coherent scattering region, microstrain, refractive index, extinction coefficient, optical band gap.

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