Semiconductor Physics, Quantum Electronics & Optoelectronics. 2011. V. 14, N 2. P. 183-187.
DOI: https://doi.org/10.15407/spqeo14.02.183


Influence of electron-electron drag on piezoresistance of n-Si
I.I. Boiko

V. Lashkaryov Institute of Semiconductor Physics, NAS of Ukraine, 45, prospect Nauky, 03028 Kyiv, Ukraine E-mail: igorboiko@yandex.ru; phone: (044)236-5422

Abstract. Piezoresistance of n-Si is considered with due regard for inter-valley drag. It has been shown that inter-valley drag gains the piezocoefficient and diminishes the mobility. In the region of nondegenerate carriers, the effect of drag increases when the carrier concentration rises and temperature falls.

Keywords: silicon, balance equation, mobility, piezoresistance, inter-valley drag.

Full Text (PDF)

Back to N2 Volume 14