Semiconductor Physics, Quantum Electronics & Optoelectronics. 2014. V. 17, N 3. P. 284-290.
https://doi.org/10.15407/spqeo17.03.284

                                                                 

Optical and morphological properties of tetragonal Cu2ZnSnS4 thin films grown from sulphide precursors at lower temperatures
I.S. Babichuk1, *, V.O. Yukhymchuk1, M.O. Semenenko1, N.I. Klyui1, R. Caballero2, O.M. Hreshchuk1, I.S. Lemishko3, I.V. Babichuk4, V.O. Ganus1, and M. Leon2

1V. Lashkaryov Institute of Semiconductor Physics, NAS of Ukraine,
45, prospect Nauky, 03028 Kyiv, Ukraine;
2Universidad Autonoma de Madrid, Departamento de Fisica Aplicada,
C/Francisco Tomas y Valiente 7, E-28049 Madrid, Spain;
3National Technical University of Ukraine "Kyiv Polytechnic Institute",
37, prospect Peremohy, 03056 Kyiv, Ukraine;
4V. Vernadsky Institute of General and Inorganic Chemistry, NAS of Ukraine,
32/34, prospect Akademika Palladina, 03142 Kyiv, Ukraine
*Corresponding author. Phone: 38(044) 525-83-03; e-mail: babichuk@isp.kiev.ua

Abstract. Optical constants of Cu2ZnSnS4 thin films formed using thermal annealing of pre-deposited layers of copper, zinc and tin sulphides on glass substrates at different temperatures and ambient atmosphere were determined. It has been shown that films grown at lower temperatures have the tetragonal structure of kesterite, and the corresponding value of the optical band gap is 1.47 eV.

Keywords: Raman spectroscopy, SEM, optical constants, kesterite, CZTS.

Manuscript received 25.02.14; revised version received 30.07.14; accepted for publication 16.09.14; published online 30.09.14.

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