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Semiconductor Physics, Quantum Electronics & Optoelectronics. 2007. V. 10, N 4. P. 036-041.
The influence of size effects
on local piezoelectric response of thin films
V. Lashkaryov Institute of Semiconductor Physics, National Academy of Science of Ukraine
41, prospect Nauky, 03028 Kyiv, Ukraine, e-mail: morozo@i.com.ua
Abstract. T We discuss the influence of size effects on the local piezoelectric response of
thin films. In calculations of the electrostatic potential in the triple system “PFM probe tip –
film – substrate,” the effective point charge model is used. The obtained expressions for the
local piezoelectric response of a surface layer (film) capped are intended for the
calculations of Piezoresponse Force Microscopy signals of thin polar films epitaxially
grown on thick substrates. Theoretical predictions are in qualitative agreement with typical
experimental results obtained for perovskite Pb(Zr , Ti)O 3 and multiferroic BiFeO 3 films.
Keywords: local piezoelectric response, size effects.
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