¹V. Lashkaryov Institute of Semiconductor Physics, NAS of Ukraine, 41, prospect Nauky, 03680 Kyiv, Ukraine; e-mail: morozh@meta.ua ²Department of Physics, Boston College, 140 Commonwealth Avenue, Chestnut Hill, Massachusetts 02467-3804, USA; e-mail: irina.bariakhtar@gmail.com

Abstract. A possibility of determining the parameters of a coherent magneto-optical layer on a finite incoherent absorbing substrate by analyzing the spectra of its thermal radiation (TR) has been investigated. On the example of a plane-parallel InAs semiconductor plate silver-coated on the back surface, it has been shown that a complex analysis of TR spectra, both without and with the presence of magnetic field, makes it possible to determine the thickness, optical, magneto-optical and electric parameters of the layer. Algorithms for the calculation and analysis of TR spectra are adduced, which simplify determination of layer parameters and increase the accuracy of results. Comparing the position of the extremes of the experimental zero-field spectrum with the theoretical calculations, the thickness of the sample and the plasma oscillation frequency in the used semiconductor have been determined. The analysis of the relative contrast of interference oscillations in the TR spectrum in the magnetic field using previously defined parameters enabled to ascertain the spectral dependence of the Faraday rotation angle and to determine the concentration, effective mass and type of current carriers. It has been assumed, that such analysis of luminescence spectra also allows determining the parameters of magneto-optical layers and structures.

Keywords: optical constants, electric parameters, magneto-optical layers, thermal radiation, Faraday effect.

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